CERN Visits :
Mon - Wed - Thu: From 14h00 to 17h30
Fri: From 15h to 18h30
Soccer tournament (CERN Pitch - Saint Genis Pouilly)
Mon: From 18h30 to 21h00
*RADSAGA Student Breakfast: The early mornings on Tuesday to Thursday, the RADECS conference will host training sessions for all early stage researchers in the innovative training network RADSAGA. These breakfast lectures of 1 hour will be imparted by prestigious speakers from leading industries active in electronics and radiation environments.
RADSAGA is an Innovative Training Network under the Marie Skłodowska-Curie Actions in the EU Horizon2020 framework. RADSAGA stands for RADiation and Reliability Challenges for Electronics used in Space, Aviation, Ground and Accelerators. For more info please refer to http://cern.ch/radsaga.
**CERN Visits: The RADECS participants will have the possibility to visit some of the following CERN premises (at surface, depending on availabilities):
Analog and mixed-Signal integrated circuits are widely used for specific applications in different radiation environments. Robustness against radiation effects can be enhanced by a mixture of technology choice, design techniques and architecture. This session will focus on circuits designed and tested for use in such harsh environments, with emphasis on particular techniques used to ensure acceptable performance after exposure to radiation.
Session where radiation procedures and tests are evaluated at higher levels than the components one. The “system approach” involves taking in consideration the overall system as well as its parts with their respective failure rate and behavior in a radiation environment. The techniques of design for testability, fault propagation, system test approaches and mitigations are the main topics.
Materials are submitted to radiations in various frames of use: particle accelerators, space environment, fission and fusion reactors… All recent developments, problematic, irradiation tests, test results and tests methodology focused on non-metallic and non-semi-conductor materials are welcomed.
In-flight experiments, technology demonstrators and radiation environment and associated effect measurement opportunities given by CubeSats/SmallSats (1-50 kg), stratobus, new satellite constellations and atmospheric balloons projects. Papers can address low cost projects in development that use commercial electronics, innovative radiation measurement concepts, ground level assessment and how it compares to in-flight results or anomalies, radiation prediction processes and risk assessment of component and systexs.
Radiation effects campaigns focusing on when planned tests have unplanned challenges. This may include issues related to learning and recovering from: test setup problems, facility discrepancies, limited irradiation accessibility, new technology discoveries, unexpected event occurrences, and, device and error signature complexity.
All new experimental, theoretical, and simulation findings about the effects of total ionizing dose in electronic elementary devices and in digital integrated circuits.
Physical mechanisms related to the interaction of radiation with electronic and photonic materials and devices, including total ionizing dose, displacement damage, and transient effects.
All theoretical and practical aspects (activities and procedures) intended to ensure that the electronics and design approaches used in space electronic equipment and systems will lead to its nominal operation during full mission life time under the expected radiation environment.
Summaries that investigate soft- and hard-errors due to single event effects on devices and integrated circuits are encourage to apply for this session. The session covers experimental, theoretical, and simulation findings in space, terrestrial, and particle accelerator environments.
Papers that aim to improve the knowledge of the space environment (with an emphasis for the Earth and Jupiter), the terrestrial environment (atmosphere down to ground level and underground, including alpha pollutants), as well as their links with accelerators environments. Feedbacks from in-situ data to assess engineering models are also welcome.
All papers regarding unique radiation exposure facilities or novel instrumentation methods, dosimetry, and shielding. This year we would also like to encourage submissions related to high energy electron facilities that could be used to support the upcoming JUICE missions in addition to diagnostics and electronics-based dosimetry important to biomedical applications for planned missions to Mars.
Radiation Hardening by Design (RHBD) techniques to mitigate SEE and TID in different circuits, such as logic, latches and flip-flops, analog and imaging circuits, microprocessors, Application Specific Integrated Circuits (ASICs), memories, and Field Programmable Gate Arrays (FPGAs).
Latest developments and technical solutions in the areas of the generation (using different sources of radiation such as Heavy Ions, Protons, Focused Laser Light or X-rays, etc…), and the measurement and characterization techniques of SETs in analog, digital or mixed-signal devices and circuits.
All aspects of radiation effects (basic mechanisms, displacement damage, TID, SEE, …) in optoelectronic/photonic materials, devices and integrated circuits, such as image sensors, particle detectors, optical fibers, LED/LD, optical receivers/transceivers, silicon photonics...
Analysis of single event charge collection phenomena and mechanisms in analog and digital devices. Investigation of SEE in devices and the impacts of voltage scaling and the temperature (cryogenic and high temperature) on SEE sensitivity. Empirical or physical models dedicated to laser modeling, dose modeling, interactions radiations/matter, and single event effects modeling in advanced devices, circuits and systems.
Following a long RADECS tradition, a full-day short course is organized on the first day of the RADECS 2017 conference. Intended for both beginners in the field and experienced scientists, the course will cover a variety of radiation effects seen from the different perspective of experts involved in applications sharing the common constraint of radiation tolerance: Space, Avionics, Ground, and High Energy Physics. This unique opportunity to learn from renowned professionals is conceived to expose the attendees to both basic mechanisms and best practices as they have been explored and developed in the different communities over the last decades. The ambition is to enlarge the limited representation of radiation effects our daily activities in a specialized field generates, and extend it to embrace the much richer, complex and – alas – often surprising reality.
The course is organized in four main chapters, and will begin with a review of the different radiation environments encountered in our fictitious one-day travel from Space to Ground and Below. Other than describing the environments, the main constraints imposed on reliable operation of electronics components in each case will be covered. The second chapter will focus on Total Ionizing Dose effects. A first lecture will lead us through the complexity of the phenomenology of charge transport and trapping in silicon dioxide, with its consequences on the operation of CMOS and linear bipolar circuits. Difficulties and common practices in providing a reliable dosimetry during TID testing at different sources will then be discussed. During the third chapter, dedicated to displacement damage, focus will be first on basic mechanisms and their consequence in optoelectronics devices for Space missions. The same problematic will then be addressed from a High Energy Physics point of view, with particular attention to silicon detectors and their qualification for very large radiation levels. The last chapter will illustrate in sequence the industrial point of view for part qualification for Space flights, and the approach adopted instead in High Energy Physics applications. Both will present standards and best practices, and several case studies.
Electronic copies of detailed course notes will be provided to all registered attendees.